Github 开源分享:DEye,工业视觉检测



Defect Eye is an open source software library based on tensorflow1.4, which focus on surface defect inspection. The application area cover the full range of yield applications within the manufacturing environment, including incoming process tool qualification, wafer qualification, glass surface qualification, reticle qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and qualification tools find particles and pattern defects on the front surface, back surface and edge of the wafer, allowing engineers to detect and monitor critical yield excursions. Also, It can be used for medical image inpsection, including Lung PET/CT,breast MRI, CT Colongraphy, Digital Chest X-ray images.